All entries for Monday 28 April 2008

April 28, 2008

SEM of Li2O.2B2O3

Electron Microscope: ZEISS SUPRA 55-VP
Emitter: Thermal field emission type
Date: 15th May 2007
Location: Microscopy lab, Physics, Campus
Magnification: 800x
Electron Potential: 20 kV
Detection: Secondary Electron
Comments: Scanning electron microscopes are much like cameras; you have to control the focus, brightness, contrast, zoom level. They are also very unlike optical equipment; focus in x and y is controlled separately, you can choose to detect back-scattered electrons or secondary electrons (and more), you also get to pick how much energy the electrons have as they smash into your sample, and it’s all done in a vacuum.
Post-processing: False-coloured


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